The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Dec. 21, 2012
Accenture Global Services Limited, Dublin, IE;
David E. Ingram, Kent, GB;
Brian Ahern, Surrey, GB;
Shubhashis Sengupta, Bangalore, IN;
Anurag Dwarakanath, Bangalore, IN;
Kapil Singi, Bangalore, IN;
Anitha Chandran, Bangalore, IN;
ACCENTURE GLOBAL SERVICES LIMITED, Dublin, IE;
Abstract
A requirements testing system facilitates the review and analysis of requirement statements for software applications. The requirements testing system automatically generates test artifacts from the requirement statements, including test scenarios, test conditions, test hints, and expected results. These test artifacts characterize the requirements statements to provide valuable analysis information that aids understanding what the intentions of the requirement statements are. The automation of the generation of these test artifacts produces numerous benefits, including fewer errors, objectivity, and no dependency on the skills and experience of a creator.