The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Oct. 16, 2014
Accenture Global Services Limited, Dublin, IE;
Anurag Dwarakanath, Bangalore, IN;
Aruna Jankiti, Bangalore, IN;
Accenture Global Services Limited, Dublin, IE;
Abstract
A system generates a test path set in a very efficient manner. The test path set may be tailored to test a target physical system, such as a complex set of source code, a manufacturing line of multiple process nodes, or other physical system. The system may generate the test path set to meet certain goals in testing the target physical system, for example comprehensive testing of system paths, system nodes, or particular subsets. As one example, the system may efficiently generate a test path set that uses the minimum number of test paths to test a coverage goal, for example traversing each of the prime paths in the target physical system.