The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Oct. 05, 2011
Itai Segall, Tel-Aviv, IL;
Rachel Tzoref-brill, Haifa, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method executable on one or more processors for modeling a test space is provided. The method may include defining a coverage model including a set of variables. The method may also include selecting one or more variables within at least one subset of a plurality of subsets of the set of variables. The selection may be according to an interaction level requirement defined for at least one or more of the subsets, whereby the interaction level corresponds to a coverage of the test space that covers a plurality of possible combinations of the one or more variables at multiple levels. Furthermore, respective values for the one or more selected variables within the subset of the set of variables may be assigned. The method may also include one or more definitions for value combinations for said variables with assigned values.