The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jun. 07, 2013
Applicant:

New York University, New York, NY (US);

Inventor:

Ozgur Sinanoglu, Abu Dhabi, UA;

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06F 11/22 (2006.01); G06F 11/267 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/2242 (2013.01); G06F 11/267 (2013.01); G06F 11/1641 (2013.01);
Abstract

Exemplary system, method and computer-accessible medium for testing a multi-core chip can be provided which can have and/or utilize a plurality of identical cores. This can be performed by comparing each core with as many as at least the number of spare cores plus 1 using a comparator; the number of comparators can equal the total number of cores multiplied by one-half the number of spare cores plus 1. A mismatch between two cores can identify at least one of the two cores as defective and a perfect match between two cores can identify both cores as not defective. The multi-core chip can fail the test if the number of defective cores can be greater than the number of spare cores.


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