The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Mar. 07, 2014
Applicant:
Marvell International Ltd., Hamilton, BM;
Inventors:
Jin Xie, Longmont, CO (US);
Mats Öberg, San Jose, CA (US);
Assignee:
MARVELL INTERNATIONAL LTD., , BM;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01); G11B 20/18 (2006.01); G11B 27/36 (2006.01); G06F 11/07 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/073 (2013.01); G11B 20/10314 (2013.01); G11B 20/18 (2013.01); G11B 20/1816 (2013.01); G11B 2220/2537 (2013.01);
Abstract
Devices, methods, and other embodiments associated with adjusting a defect threshold are described. In one embodiment, a method includes determining, using a defect threshold, when a read channel has read data from a defective portion of a storage medium. The defect threshold is adjusted based, at least in part, on a gain value and a delayed gain value of a gain loop of the read channel.