The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Jun. 26, 2009
Cindy Bassompiere, Algueblanche, FR;
Yanis Caritu, Saint Joseph la Riviere, FR;
Bruno Flament, Saint Julien de Ratz, FR;
Andrea Vassilev, Grenoble, FR;
Cindy Bassompiere, Algueblanche, FR;
Yanis Caritu, Saint Joseph la Riviere, FR;
Bruno Flament, Saint Julien de Ratz, FR;
Andrea Vassilev, Grenoble, FR;
MOVEA, Grenoble, FR;
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;
Abstract
The invention applies to a pointing device of a mobile element, for example a cursor, on a plane surface. The pointing device comprises a first sensor for measuring the angular rates of the device and a second sensor of the linear accelerations along three dimensions of said device. Preferably, the first sensor is a two-axis or three-axis gyrometer and the second sensor is a three-axis accelerometer. The invention makes it possible to render the movements of the mobile element in the surface of the orientation in which the pointing device is held by its user. This result is achieved by global resolution of the angles of torsion by combining the measurements of the first and second sensors either within an extended Kalman filter or by application of an optimization criterion. The invention also provides a method for estimating the parameters which characterize motion and/or orientation of an object in space from said combination of the measurements of the first and second sensors either within an extended Kalman filter or by application of an optimization criterion.