The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Sep. 22, 2014
Applicant:

Beet, Llc, Plymouth, MI (US);

Inventors:

David Wang, Northville, MI (US);

Daisy Red, Royal Oak, MI (US);

Ivan Nausley, Dearborn, MI (US);

Assignee:

BEET LLC, Plymouth, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 9/02 (2006.01); G06F 11/30 (2006.01); G05B 23/02 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G05B 9/02 (2013.01); G05B 23/0232 (2013.01); G06N 5/04 (2013.01);
Abstract

Disclosed herein is a method for monitoring performance of equipment located in an automation environment including identifying a sequence of tasks performed by the equipment, wherein each task in the sequence is defined by a series of signals; for each task in the sequence: (a) collecting data pertaining to the series of signals; (b) determining a completion time based on the collected data; and (c) determining a difference between the determined completion time and a predetermined reference value indicative of an expected completion time; repeating (a)-(c) for a plurality of repetitions of the sequence; summing, over the plurality of repetitions of the sequence, at least some of the determined differences to calculate an accumulated variance value for each given task; and selectively generating a predictive failure indication based on the accumulated variance values.


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