The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Oct. 09, 2014
Applicant:

Leidos, Inc., Reston, VA (US);

Inventors:

Eric Matthew Amendt, San Diego, CA (US);

Ryan Shyffer, San Diego, CA (US);

Assignee:

Leidos, Inc., Reston, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/18 (2006.01);
U.S. Cl.
CPC ...
G01T 1/18 (2013.01);
Abstract

A Geiger-Mueller charge particle rate measurement system includes a clock management unit in combination with multiple oscillators and rate feedback controller to allow for reactive switching between the different oscillator frequencies to optimize system use. Controlling the clock management unit to send the appropriate frequency (clock signal) to the timers in response to measured rate date from the rate feedback controller facilitates operation at different clock speeds, which helps reduce power consumption when operated at lower speeds.


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