The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Nov. 27, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Cihun-Siyong Gong, Kaohsiung, TW;

Yi-Feng Luo, Yilan County, TW;

Li-Ren Huang, Zhubei, TW;

Kai-Cheung Juang, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); G01N 27/02 (2006.01); A61B 5/053 (2006.01); A61B 5/01 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3634 (2013.01); A61B 5/01 (2013.01); A61B 5/053 (2013.01); G01N 27/02 (2013.01);
Abstract

An impedance analysis device adapted to an object under test (OUT) includes a signal generator, a signal analysis unit and a processing unit. The signal generator outputs a pulse signal to the OUT. The signal analysis unit acquires a response signal which the OUT responds to the pulse signal, and analyzes the response signal to obtain an analysis parameter. The processing unit coupled to the signal analysis unit receives the analysis parameter, so as to obtain an impedance variation characteristic of the OUT.


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