The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

May. 13, 2013
Applicant:

Kabushiki Kaisha Tokai Rika Denki Seisakusho, Aichi, JP;

Inventor:

Tomomi Shimizu, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 31/28 (2006.01); H03K 17/96 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2605 (2013.01); G01R 31/2829 (2013.01); H03K 17/9622 (2013.01); H03K 2217/960705 (2013.01);
Abstract

An electrostatic capacitance detection device includes a plurality of electrodes configured to detect an electrostatic capacitance, an electrostatic capacitance measurement part configured to select one electrode from the plurality of electrodes as a detection electrode, to allow the electrodes other than the detection electrode to be in a first electric potential condition and then to be in a second electric potential condition that is different from the first electric potential condition, and to measure a first voltage of the detection electrode in the first electric potential condition and a second voltage of the detection electrode in the second electric potential condition, and a judgment part configured to compare measurement values based on the first and the second voltages of the detection electrode, thereby to judge whether the detection electrode is in a short circuit condition.


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