The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Dec. 28, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Yongjae Lee, Niskayuna, NY (US);

Victoria Eugenia Cotero, Niskayuna, NY (US);

Jon Albert Dieringer, Schenectady, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/026 (2013.01);
Abstract

A method for analyzing a sample includes providing a sensor assembly having a sensing region with a plurality of resonant circuits, and a plurality of tuning elements. The method further includes exposing the sensor assembly to an environment comprising the sample, and probing the sample with one or more frequencies generated by the sensor assembly. Furthermore, the method includes determining an impedance of a sensor response over a measured spectral frequency range of the sensor assembly, and relating measurement of impedance of the sensor assembly to at least one environmental property of the sample.


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