The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Jun. 14, 2013
General Electric Company, Schenectady, NY (US);
University of Notre Dame Du Lac, Notre Dame, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Jean-Baptiste Thibault, Milwaukee, WI (US);
Xue Rui, Clifton Park, NY (US);
Somesh Srivastava, Waukesha, WI (US);
Ken David Sauer, South Bend, IN (US);
Lin Fu, Niskayuna, NY (US);
Charles Addison Bouman, Jr., West Lafayette, IN (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
A system and method include acquisition of projection data from a scanned object, the set of projection data comprising a plurality of projection measurements. The system and method also include calculation of a set of modified statistical weights from the projection data, wherein a respective modified statistical weight of the set of modified statistical weights comprises a deviation from an inverse variance of a corresponding projection measurement of the projection data. The system and method further include reconstruction of an image of the scanned object using the set of modified statistical weights as coefficients in an iterative reconstruction algorithm.