The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jan. 25, 2012
Applicants:

Mohammad Hassan Arbab, Seattle, WA (US);

Dale P. Winebrenner, Seattle, WA (US);

Antao Chen, Lake Forest Park, WA (US);

Eric I. Thorsos, Woddinville, WA (US);

Inventors:

Mohammad Hassan Arbab, Seattle, WA (US);

Dale P. Winebrenner, Seattle, WA (US);

Antao Chen, Lake Forest Park, WA (US);

Eric I. Thorsos, Woddinville, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3586 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01N 2201/129 (2013.01);
Abstract

A method and system for analyzing noisy terahertz spectroscopy data transforms the measured time-dependent data into frequency space, for example, using a discrete Fourier transform, and then transforms the frequency spectrum into wavelet frequency space. The twice-transformed data is analyzed to identify spectroscopic features of the signal, for example, to identify a resonance frequency. The method may be used, for example, in a stand-off detector to identify particular chemicals in a target.


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