The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Jun. 27, 2014
Shimadzu Corporation, Kyoto, Kyoto, JP;
Haruo Shimaoka, Nara, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A particle size distribution measuring apparatus having: a light intensity distribution obtaining unit for obtaining the light intensity distribution that occurs when the sample cell is irradiated with light for measurement from a light source through detection by a detector; and a particle size distribution calculating unit for calculating the particle size distribution of the particles to be measured included in the sample by using the light intensity distribution obtained by the light intensity distribution obtaining unit, the temperature adjusting member for adjusting the temperature of the sample cell is movable between a first location along the light path around the sample cell and a second location that is outside the light path, and the temperature adjusting member is moved to the second location when the sample is irradiated with the light for measurement from the light source.