The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
May. 08, 2012
Kirsten Meetz, Hamburg, DE;
Martin Bergtholdt, Hamburg, DE;
Thomas Buelow, Grosshansdorf, DE;
Ingwer-curt Carlsen, Hamburg, DE;
Rafael Wiemker, Kisdorf, DE;
Kirsten Meetz, Hamburg, DE;
Martin Bergtholdt, Hamburg, DE;
Thomas Buelow, Grosshansdorf, DE;
Ingwer-Curt Carlsen, Hamburg, DE;
Rafael Wiemker, Kisdorf, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A system for generating a slicing scheme for slicing a specimen is disclosed. A parameter unit () is arranged for determining at least one parameter of a lesion in a specimen, based on an image dataset () representing at least part of the specimen. A slicing scheme unit () is arranged for determining a slicing scheme () for pathologic examination of the specimen, based on the at least one parameter. A specimen preparation unit () is arranged for determining a slicing preparation protocol, based on the image dataset, wherein the slicing preparation protocol comprises a representation of preparation steps relating to the specimen. A segmentation unit () is arranged for segmenting the lesion in the image dataset (), wherein the parameter unit () is arranged for determining the at least one parameter, based on the segmented lesion.