The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Mar. 11, 2014
Applicant:

Interlink Electronics, Inc., Camarillo, CA (US);

Inventors:

Jeffrey R. Baker, Thousand Oaks, CA (US);

Edwin Keshesh Yousafian, Tujunga, CA (US);

Declan Christopher Flannery, Venice, CA (US);

Assignee:

Interlink Electronics, Inc., Camarillo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/16 (2006.01); G01L 9/02 (2006.01); G01L 9/06 (2006.01);
U.S. Cl.
CPC ...
G01L 1/16 (2013.01); G01L 9/02 (2013.01); G01L 9/065 (2013.01);
Abstract

Certain implementations of the disclosed technology may include systems, methods, and apparatus for common mode signal cancellation in force change detectors. An example embodiment of the disclosed technology includes a press sensor element configured to reduce or eliminate thermally induced signals. The sensor element includes a piezoelectric layer that includes a first surface in communication with a first layer. The first layer includes a first conductive region. The piezoelectric layer includes a second surface in communication with a second layer. The second layer includes a second conductive region, a third conductive region, and a non-conductive void region separating the second conductive region and the third conductive region. The second and third conductive regions are configured to substantially reduce a thermally-induced voltage change between two or more of the first, second and third conductive regions responsive to a corresponding temperature change of at least a portion of the piezoelectric layer.


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