The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2016
Filed:
Dec. 19, 2014
Carl Zeiss Ag, Oberkochen, DE;
Carl Zeiss Meditec Ag, Jena, DE;
Markus Seesselberg, Aalen, DE;
Tobias Breuninger, Herbrechtingen, DE;
Marco Wilzbach, Stuttgart, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
CARL ZEISS AG, Oberkochen, DE;
Abstract
An apparatus for determining an ametropia of an eyecomprises a measurement light sourceand beam formation opticsand an analysis modulecomprising a detectorand analysis optics. The analysis optics are configured to focus a parallel light beam, entering through the optical interface, along a predetermined line extending transverse to a direction of the analysis beam path. The detector is a spatially resolving detector, wherein an acute angle between a surface normal of the detection area and the predetermined line is less than 80°. A controlleris configured to obtain light intensity data detected by the detector and to determine ametropia-data representing the ametropia of the eye based on the light intensity data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile