The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jan. 23, 2014
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventor:

Yuji Murase, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/1025 (2013.01); A61B 3/1233 (2013.01);
Abstract

There is provided an ophthalmic imaging apparatus including an optical coherence tomography (OCT) optical system for acquiring a tomographic image of a subject eye, an observation optical system configured to acquire a front image of the subject eye. The apparatus functions as an image generation unit which repeatedly generates the tomographic image based on an output signal from the OCT optical system, and repeatedly generates the front image based on an output signal from the observation optical system, a determination unit which detects a positional deviation between a reference front image and each of front images generated by the image generation unit, and determines consecutiveness of the front images whose positional deviation satisfies a permissible range, and a selection process unit which selects one of multiple tomographic images generated by the image generation unit, based on a determination result by the determination unit.


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