The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Sep. 29, 2006
Applicants:

Robert L Goodwin, Mercer Island, WA (US);

David Zhao, Bothell, WA (US);

Adrian Tsang Kwong Chan, Bellevue, WA (US);

Chieh Wang, Issaquah, WA (US);

Michael V Rykov, Seattle, WA (US);

Inventors:

Robert L Goodwin, Mercer Island, WA (US);

David Zhao, Bothell, WA (US);

Adrian Tsang Kwong Chan, Bellevue, WA (US);

Chieh Wang, Issaquah, WA (US);

Michael V Rykov, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0852 (2013.01); H04L 41/5022 (2013.01); H04L 41/5035 (2013.01);
Abstract

A system and method for managing performance metric information is provided. Baseline performance metrics, such as network bandwidth capabilities, of various client computing devices may be obtained. The baseline performance metrics can be used to separate client computing devices into one or more groups. Based on the groupings, subsequent performance metrics associated with the one or more monitored groups can be collected in a manner to mitigate performance latencies associated with the baseline performance metric. The subsequent performance metrics can be processed to determine which metrics correspond to a potential performance problem.


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