The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Mar. 15, 2013
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Ming C. Hao, Palo Alto, CA (US);

Michael Hund, Steiβlingen, DE;

Umeshwar Dayal, Saratoga, CA (US);

Soma Sundaram Santhiveeran, Fremont, CA (US);

Halldor Janetzko, Steiβlingen, DE;

Sebastian Mittelstaedt, Constance, DE;

Daniel Keim, Constance, DE;

Meichun Hsu, Los Altos Hills, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06Q 30/0201 (2013.01);
Abstract

Visual analytics for multivariate session data using concentric rings with overlapping periods includes displaying an interactive graph in a display. The interactive graph includes at least a portion of multiple concentric rings where each one of at least some of the multiple concentric rings represents periodic time units. At least some of the multiple concentric rings are divided into cells where the cells represent smaller time periods than the time units. A color of each of the cells represents a value of a metric. Also, an overlapping period ring displayed with the multiple concentric rings where the overlapping period ring comprises segments that represent overlapping metrics from the cells of the concentric rings that correspond with the segments.


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