The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Feb. 26, 2014
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Adam Petschke, Lake Bluff, IL (US);
Yu Zou, Naperville, IL (US);
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
TOSHIBA MEDICAL SYSTEMS CORPORATION, Otawara-shi, JP;
Abstract
A method and an apparatus for determining primary and secondary escape probabilities for a large photon-counting detector without pile-up. A model for the detector with no pile-up is formulated and used for spectrum correction in a computed tomography scanner. The method includes computing primary K-escape and secondary K-escape probabilities occurring at a certain depth within the photon-counting detector. Further, a no pile-up model for the photon-counting detector is formulated by determining a response function, based on the computed primary and secondary K-escape probabilities and geometry of the photon-counting detector. The method includes obtaining a measured CT scan of an object and further performs spectrum correction by determining the incident input spectrum based on the response function and the measured spectrum of the large photon-counting detector.