The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Apr. 08, 2013
SK Hynix Memory Solutions Inc., San Jose, CA (US);
Xiangyu Tang, San Jose, CA (US);
Lingqi Zeng, Turlock, CA (US);
Jason Bellorado, San Jose, CA (US);
Frederick K. H. Lee, Mountain View, CA (US);
Arunkumar Subramanian, Santa Clara, CA (US);
SK Hynix memory solutions inc., San Jose, CA (US);
Abstract
A system and method for determining soft read data for a group of cells in a nonvolatile flash memory are disclosed. An expected value representative of a plurality of stored values in a group of cells is obtained. A measured value representative of the plurality of stored values in the group of cells is obtained, based on a single read to the group of cells. A soft read data for the group of cells is determined based at least in part on the expected value and the measured value. The expected and measured values may include at least one of a number of 0s, a number of 1s, a ratio of 0s to 1s or a ratio of 1s to 0s. A reliability for a bit i may be obtained using a one-step majority logic decoder, and a threshold reliability may be used when determining the soft read data.