The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Aug. 05, 2013
Applicant:

Vce Company, Llc, Richardson, TX (US);

Inventors:

Sampath Rajagopal, Fremont, CA (US);

John James Mulqueeney, Jr., San Bruno, CA (US);

Jonathan Streete, San Jose, CA (US);

Assignee:

VCE Company, LLC, Richardson, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3604 (2013.01); G06F 11/36 (2013.01);
Abstract

A method, system and computer-readable media for analyzing application environments is provided. Embodiments of the invention includes generating a first representation of a first environment for an application and a second representation of a second environment for the application. Determining differences between the first representation and the second representation and determining relevance to the application of each of the differences as to a likelihood of failure of operation of the application in the second environment where at least one method operation is executed through a processor.


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