The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Oct. 30, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Ajay K. Mahajan, Austin, TX (US);
Venkatesh Sainath, Bangalore, IN;
Vishwanatha Subbanna, Bangalore, IN;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0745 (2013.01); G06F 11/0778 (2013.01);
Abstract
In an approach for determining a location of failure between interconnects/controller, a computer collects debug information simultaneously at a plurality of nodes coupled to an interconnect. Subsequent to collecting debug information, the computer analyzes the debug information collected simultaneously thereby determining which end of the interconnect caused the failure.
Quick Actions:
Mahajan, Ajay. (2016). Synchronized debug information generation (U.S. Patent No. 9256489). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9256489
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