The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Feb. 20, 2014
Applicant:

The Mathworks, Inc., Natick, MA (US);

Inventors:

Sankalp S. Modi, Acton, MA (US);

Wang Chen, Brookline, MA (US);

Zhihong Zhao, Newton, MA (US);

Partha Biswas, Wayland, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 8/35 (2013.01);
Abstract

A device is configured to receive optimization information associated with a model, determine an amount of delay to be inserted into the model, and determine a sampling factor by which a first data rate associated with a signal is to be modified into a second data rate. The device is configured to determine a region of interest, insert an upsampling block that upsamples the signal entering the region of interest based on the sampling factor, and insert a downsampling block, associated with a unit of delay, which downsamples the signal exiting the region of interest based on the sampling factor. The device is configured to convert the unit of delay into a fast delay block, corresponding to the amount of delay, and insert the fast delay block in the region of interest. The device is configured to generate code associated with the model, and provide the code.


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