The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

May. 13, 2011
Applicants:

Ricardo R. Salaverry, San Jose, CA (US);

James G. Quaderer, Sunnyvale, CA (US);

Francis Lau, Fremont, CA (US);

Joel C. Kent, Fremont, CA (US);

Inventors:

Ricardo R. Salaverry, San Jose, CA (US);

James G. Quaderer, Sunnyvale, CA (US);

Francis Lau, Fremont, CA (US);

Joel C. Kent, Fremont, CA (US);

Assignee:

Elo Touch Solutions, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G06F 3/041 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G01R 27/2605 (2013.01); G06F 2203/04104 (2013.01); G06F 2203/04107 (2013.01); G06F 2203/04108 (2013.01); G06F 2203/04112 (2013.01);
Abstract

A projected capacitive touch sensor system includes a substrate that defines a plurality of non-overlapping areas. Each non-overlapping area includes a plurality of detection electrodes arranged in non-overlapping columns. The columns include a horizontal detection electrode that extends along substantially an entire height of a first column, and at least a second column of at least two vertical detection electrodes that are electrically isolated from one another. The system further includes a measuring circuit configured to measure a mutual capacitance between the horizontal detection electrode and each of the at least two vertical detection electrodes in a given area. A processing logic circuit of the system is configured to determine horizontal detection electrode and vertical detection electrode combinations that have a changed mutual capacitance. The processing logic is also configured to determine the touch location based on a location of the determined horizontal detection electrode and vertical electrode combinations.


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