The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Sep. 24, 2012
Applicants:
Christian Theriault, Princeton, NJ (US);
Craig B. Arnold, Princeton, NJ (US);
Inventors:
Christian Theriault, Princeton, NJ (US);
Craig B. Arnold, Princeton, NJ (US);
Assignee:
TAG OPTICS INC., Princeton, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/14 (2006.01); G02B 21/00 (2006.01); G02B 3/00 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 3/14 (2013.01); G02B 3/0087 (2013.01); G02B 21/00 (2013.01); G02B 21/025 (2013.01);
Abstract
A microscope, comprising a stage onto which is placed an item, a lens having a tunable acoustic gradient index of refraction (TAG lens) sufficiently proximate to said stage to magnify an image of the item, a viewing point for providing for viewing of the magnified image, and a pulsed illuminator capable of illuminating the stage and synchronously pulsed with an operating frequency of the TAG lens.