The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Mar. 05, 2013
Applicant:

Azbil Corporation, Tokyo, JP;

Inventors:

Makoto Saruwatari, Tokyo, JP;

Hiroaki Narita, Tokyo, JP;

Takuji Abe, Tokyo, JP;

Assignee:

AZBIL CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/14 (2006.01); G01R 35/00 (2006.01); G01R 31/28 (2006.01); G01R 31/02 (2006.01); G01D 5/165 (2006.01);
U.S. Cl.
CPC ...
G01R 27/14 (2013.01); G01R 31/2829 (2013.01); G01R 35/00 (2013.01); G01D 5/165 (2013.01); G01R 31/02 (2013.01);
Abstract

In a method for evaluating degradation of a potentiometer, a plurality of evaluation items, from minor to major, are established as evaluation items for degradation in performance prior to failure of a potentiometer. The degradation of the potentiometer in performance of the plurality of evaluation items is evaluated in terms of stages, in a specific sequence.


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