The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Jan. 02, 2013
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Arkray, Inc., Kyoto-shi, Kyoto, JP;
Toru Mizumoto, Hyogo, JP;
Keisuke Tsutsumida, Hyogo, JP;
Takayoshi Izumi, Hyogo, JP;
Koji Fujimoto, Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
A sample analyzer includes a first measurement unit, a second measurement unit, a detection section which detects information about an amount of a sample in a sample container before the first measurement unit aspirates the sample in the sample container, and a control section. Based on a detection result by the detection section and based on information about a predetermined sample amount necessary for performing both in the first measurement unit and the second measurement unit, when the control section has determined that the amount of the sample in the sample container is insufficient for the predetermined sample amount, the control section controls the first measurement unit and the second measurement unit so as not to aspirate the sample in the sample container.