The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Mar. 13, 2013
Applicants:

Gerald J. Bruck, Oviedo, FL (US);

Brandon W. Shinn, Houston, TX (US);

Ahmed Kamel, Orlando, FL (US);

Inventors:

Gerald J. Bruck, Oviedo, FL (US);

Brandon W. Shinn, Houston, TX (US);

Ahmed Kamel, Orlando, FL (US);

Assignee:

Siemens Energy, Inc., Orlando, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); B23K 37/04 (2006.01); B23K 31/12 (2006.01); G01N 3/58 (2006.01);
U.S. Cl.
CPC ...
G01N 33/00 (2013.01); B23K 31/12 (2013.01); B23K 37/0408 (2013.01); B23K 37/0452 (2013.01); G01N 3/58 (2013.01);
Abstract

An apparatus () and method for evaluating an effect of a surface presentation angle (A). The apparatus supports a plurality of samples () separated by support plates () between end plates () in a shish kebab arrangement. A groove () is formed on each side of each support plate for receiving an edge of each respective sample at a different angle relative to an axis of impingement (). A clamping mechanism () holds the end plates, support plates and samples together in the fixed orientation exposing each sample surface at a different presentation angle, yet at the same distance from a process end effector (). The sample impingement surfaces are exposed to the process, and the effect of the different surface presentation angles is determined from the samples. Process variables to counter the effects of surface presentation angle may be identified and controlled.


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