The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Oct. 13, 2010
Hiroyuki Nose, Tokyo, JP;
Hajime Kuwabara, Tokyo, JP;
Tetsuya Kobayashi, Tokyo, JP;
IHI Corporation, Tokyo, JP;
Abstract
A method of non-destructive inspection of a subject body including an element is comprised of irradiating the subject body with a neutron ray through a first measurement point and a second measurement point; measuring an elapsed time after a first time point when a resonant neutron specific to the element passes through the first measurement point and before a second time point when a prompt gamma ray made emitted by the resonant neutron from the subject body is detected at the second measurement point; and determining a location of the element in the subject body by the first measurement point, the second measurement point, a relative position toward a surface of the subject body, and the elapsed time.