The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Mar. 14, 2013
R. Bruce Weisman, Houston, TX (US);
Paul A. Withey, League City, TX (US);
Sergei M. Bachilo, Houston, TX (US);
Satish Nagarajaiah, Sugar Land, TX (US);
Venkata Srivishnu M. Vemuru, Houston, TX (US);
R. Bruce Weisman, Houston, TX (US);
Paul A. Withey, League City, TX (US);
Sergei M. Bachilo, Houston, TX (US);
Satish Nagarajaiah, Sugar Land, TX (US);
Venkata Srivishnu M. Vemuru, Houston, TX (US);
WILLIAM MARSH RICE UNIVERSITY, Houston, TX (US);
Abstract
In some embodiments, the present invention provides methods of detecting strain associated with an object by: (1) irradiating a composition that has been applied to the object, where the composition comprises semiconducting single-walled carbon nanotubes; (2) measuring an emission from the irradiated composition, where the emission comprises near infrared emission; and (3) correlating the near infrared emission to the presence or absence of strain associated with the object. In some embodiments, the aforementioned steps occur without physically contacting the object or the composition. In some embodiments, the aforementioned steps occur without utilizing Raman spectroscopy. Further embodiments of the present invention also include a step of applying the composition to the object.