The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Dec. 12, 2014
Metal Industries Research & Development Centre, Kaohsiung, TW;
Hsiu-An Tsai, Tainan, TW;
Nai-Chun An, Kaohsiung, TW;
METAL INDUSTRIES RESEARCH & DEVELOPMENT CENTRE, Kaohsiung, TW;
Abstract
A measuring method for linear stage used for measuring a displacement volume of a linear stage includes a light source, a two-dimensional grating, a quadrant photodiode and a processor. The light source provides an incident light, and the two-dimensional grating is disposed in light path of the incident light and reflects the incident to form a reflection light. The quadrant photodiode is disposed in light path of the reflection light and receives the reflection light for generating a plurality of sensing signals. The processor receives the sensing signals and utilizes the sensing signals to calculate a slope signal by a slope signal equation of the two-dimensional grating and an initial position signal and an end position signal by a position signal equation of the two-dimensional grating. The processor obtains the displacement volume of the linear stage by the slope signal, the initial position signal and the end position signal.