The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Mar. 15, 2013
National Taiwan University, Taipei, TW;
NATIONAL TAIWAN UNIVERSITY, Taipei, TW;
Abstract
A system and a method for monitoring change of intraocular pressure and a contact lens for sensing change of intraocular pressure are provided. The contact lens includes a first material layer and a first pattern. The center of the first material layer has an optical region, and the optical region corresponds to a cornea region of an eyeball. The first pattern is formed on the optical region. Furthermore, the contact lens may further include a second material layer and a second pattern. The second material layer is located on the first material layer. The second pattern is formed on the second material layer and overlaps with the first pattern to form a moire pattern.