The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2016
Filed:
Mar. 11, 2014
Applicant:
Riken, Saitama, JP;
Inventors:
Assignee:
RIKEN, Saitama, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/117 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1173 (2013.01);
Abstract
The present invention provides a method of measuring the elasticity of crystalline lens and an apparatus for measuring the elasticity of the crystalline lens for measuring stiffness of the crystalline lens, wherein the crystalline lensis irradiated with pulse laser light to generate photoelastic waves from the crystalline lens, and the photoelastic waves from the crystalline lensare measured.
Wada, Satoshi. (2016). Method of measuring the elasticity of crystalline lens, a method of determining whether crystalline lens is presbyopic, an apparatus for measuring the elasticity of crystalline lens and an apparatus for determining whether crystalline lens is presbyopic (U.S. Patent No. 9254082). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9254082
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile