The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Mar. 15, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Harpreet Singh, Lenexa, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01);
Abstract

Techniques are disclosed to determine error propagation for a query optimizer component of a database management system for a database. A database query is received that specifies one or more query conditions. Measures of actual and estimated selectivity of the one or more query conditions are determined. A measure of estimated deviation between the measures of actual and estimated selectivity is determined. A query execution plan is generated or selected based on the measure of estimated deviation.


Find Patent Forward Citations

Singh, Harpreet. (2016). Estimating error propagation for database optimizers (U.S. Patent No. 9251213). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9251213

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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