The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Mar. 27, 2009
Applicants:

Wu Cao, Redwood City, CA (US);

Sridhar Ganti, Alameda, CA (US);

Balaji Gadhiraju, Cupertino, CA (US);

Inventors:

Wu Cao, Redwood City, CA (US);

Sridhar Ganti, Alameda, CA (US);

Balaji Gadhiraju, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30469 (2013.01); G06F 17/30445 (2013.01);
Abstract

A computer-implemented method of profiling a data set in a parallel processing environment includes vertically partitioning an initial data set. One or more attribute subsets are then profiled. A list of subjects is generated each corresponding to a specific attribute value identified in the profiling. Values of multiple attributes are extracted for each identified subject, and the sample results are assembled and merged.


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