The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Sep. 05, 2012
Applicants:

Rémi Perenon, Voiron, FR;

Ali Mohammad-djafari, Orsay, FR;

Pierre Grangeat, Saint Ismier, FR;

Inventors:

Rémi Perenon, Voiron, FR;

Ali Mohammad-Djafari, Orsay, FR;

Pierre Grangeat, Saint Ismier, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G06F 17/18 (2006.01); B82Y 15/00 (2011.01); B82Y 35/00 (2011.01); G01N 29/02 (2006.01); G01N 29/30 (2006.01); H01J 49/00 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); B82Y 15/00 (2013.01); B82Y 35/00 (2013.01); G01N 29/022 (2013.01); G01N 29/30 (2013.01); G06F 19/703 (2013.01); H01J 49/0018 (2013.01); G01N 2291/0255 (2013.01); G01N 2291/0256 (2013.01); G01N 2291/0427 (2013.01); G06F 19/707 (2013.01);
Abstract

A method for estimating a molecular mass parameter in a sample that includes at least one component of given molecular mass, comprising the steps consisting of passing the sample through a processing chain comprising a mass spectrometer with a MEMS or NEMS electromechanical sensor, in this way obtaining a signal representing the molecular mass parameter and estimating the molecular mass parameter by means of a signal processing device. The molecular mass parameter is defined on the basis of a parameter of time distribution of successive detections, by the MEMS or NEMS electromechanical sensor, of the adsorption of said component, and the estimation of the molecular mass parameter is made by Bayesian inference, on the basis of a direct analytical modeling of said signal according to the molecular mass parameter and to technical parameters of the processing chain comprising at least one technical parameter of the MEMS or NEMS electromechanical sensor.


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