The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Mar. 07, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Craig T. Atherton, Burlington, VT (US);

Avishai Fedida, Haifa, IL;

Olaf K. Hendrickson, Rochester, MN (US);

Oz Hershkovitz, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01);
Abstract

A method and apparatus are provided for implementing automated memory address recording in constrained random test generation for verification of processor hardware designs. A test generation program includes a built in feature to keep track of storage addresses used and to make the addresses available to the test definition. This built in feature of a constrained random test generator allows storage addresses used in the past to be accessed by the current instruction generation eliminating the requirement of deliberately establishing target addresses first. This allows separate test events to interact with the same storage addresses without having to write a special test.


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