The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Dec. 05, 2012
Naoki Miyatake, Kanagawa, JP;
Naoki Miyatake, Kanagawa, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An optical scanning device includes a plurality of light sources configured to emit a plurality of light beams, respectively; an optical deflector having a deflection-reflection surface that deflects and reflects the light beams, each of the light beams being incident on the deflection-reflection surface at an oblique incident angle, the oblique incident angles of the light beams being different from one another; and a flat glass arranged to be tilted at a tilt angle with respect to the deflection-reflection surface in a sub-scanning direction, the light beams being incident on the deflection-reflection surface via the flat glass, the tilt angle being smaller than a largest one of the oblique incident angles of the light beams. The light beams deflected and reflected by the deflection-reflection surface are incident on a plurality of scanned surfaces via the flat glass, respectively.