The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Oct. 11, 2011
Albrecht Weiss, Linden, DE;
Arnold Mueller-rentz, Brechen, DE;
Klaus-peter Schwaab, Braunfels, DE;
Stefan Motyka, Braunfels, DE;
Albrecht Weiss, Linden, DE;
Arnold Mueller-Rentz, Brechen, DE;
Klaus-Peter Schwaab, Braunfels, DE;
Stefan Motyka, Braunfels, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope illumination system includes a first light source configured to provide light along an optical axis and an aperture device including an aperture wheel that is rotatable about an axis of rotation. The aperture wheel includes a plurality of apertures of varying size disposed circumferentially on the aperture wheel. The aperture wheel is rotatable so as to dispose each of the apertures in a position that is centered on the optical axis so as to generate an illumination beam path that extends in a centered relationship with respect to the optical axis, and so as to dispose each of the apertures in a position that is off-center from the optical axis and that is within a defined region around the optical axis so as to generate an illumination beam path that extends off-center from the optical axis for oblique incident illumination.