The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Apr. 24, 2012
Applicants:

Bing Tang, Katy, TX (US);

Sheng Xu, Katy, TX (US);

Yu Zhang, Katy, TX (US);

Inventors:

Bing Tang, Katy, TX (US);

Sheng Xu, Katy, TX (US);

Yu Zhang, Katy, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/36 (2013.01); G01V 2210/51 (2013.01); G01V 2210/52 (2013.01);
Abstract

Computer instructions, computing device and method for processing seismic data under-sampled in an angle domain, the seismic data corresponding to a reverse time migration, three-dimensional, angle domain common image gather (ADCIG). The method includes receiving the seismic data; calculating, based on the seismic data, shot and receiver wave-fields with an RTM wave propagation engine; applying a wave-fields decomposition algorithm to obtain a propagation direction for the shot and receiver wave-fields; forming the ADCIG by applying an image condition to the shot and receiver wave-fields; determining that specular energies of the ADCIG are under-sampled around a reflection angle; during the step of forming the ADCIG, extrapolating the specular energies to a neighborhood of the reflection angle; and generating an image of a subsurface that is being surveyed based on the extrapolated specular energies.


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