The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Mar. 11, 2013
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Hung-Kai Chang, New Taipei, TW;

Chung-Yaw Su, New Taipei, TW;

Chiu-Hsien Chang, New Taipei, TW;

Assignee:

Wistron Corporation, Hsichih, New Taipei, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 1/067 (2006.01); G01R 23/16 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 1/06766 (2013.01); G01R 1/06788 (2013.01); G01R 23/16 (2013.01); G01R 31/001 (2013.01);
Abstract

A measuring system for measuring signal characteristics on a node is disclosed. The measuring system includes a contact measuring unit including a probe for contacting the node to fetch a signal on the node, an output interface, a plurality of capacitors coupled between the probe and the output interface where a capacitance of each capacitor corresponds to a frequency range, and a protection circuit, of which one terminal coupled between the probe and the output interface and the other terminal coupled to a ground terminal, and a frequency analyzer coupled to the output interface for displaying information of amplitude vs. frequency of a signal outputted from the output interface to measure the signal characteristic on the node.


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