The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Jun. 24, 2011
Philip S. Low, West Lafayette, IN (US);
Alexander Wei, West Lafayette, IN (US);
Ronald G. Reifenberger, Lafayette, IN (US);
Youngsoon Kim, West Lafayette, IN (US);
Avijit Kumar Adak, West Lafayette, IN (US);
David Lyvers, Indianapolis, IN (US);
Kulbhushan Durugkar, West Lafayette, IN (US);
Derek Doorneweerd, Lockport, IL (US);
Rajendra P. Bandari, Warangal, IN (US);
Rajesh Kumar Pandey, New Haven, CT (US);
Alexei Leonov, Lafayette, IN (US);
Walter A. Henne, Frankfort, IL (US);
Yeong E. Kim, West Lafayette, IN (US);
Philip S. Low, West Lafayette, IN (US);
Alexander Wei, West Lafayette, IN (US);
Ronald G. Reifenberger, Lafayette, IN (US);
Youngsoon Kim, West Lafayette, IN (US);
Avijit Kumar Adak, West Lafayette, IN (US);
David Lyvers, Indianapolis, IN (US);
Kulbhushan Durugkar, West Lafayette, IN (US);
Derek Doorneweerd, Lockport, IL (US);
Rajendra P. Bandari, Warangal, IN (US);
Rajesh Kumar Pandey, New Haven, CT (US);
Alexei Leonov, Lafayette, IN (US);
Walter A. Henne, Frankfort, IL (US);
Yeong E. Kim, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
Pathogens are detected through the use of mutation-resistant ligands.