The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Mar. 12, 2013
Applicant:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Inventors:
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01B 21/04 (2006.01); G01N 29/04 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01B 21/04 (2013.01); G01B 21/042 (2013.01); G01N 29/043 (2013.01); G01N 29/225 (2013.01);
Abstract
A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.