The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Aug. 28, 2012
Richard H. Bossi, Renton, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Clarence L. Gordon, Iii, Renton, WA (US);
Jeffrey R. Kollgaard, Seattle, WA (US);
William P. Motzer, Seattle, WA (US);
Alan Frank Stewart, Seattle, WA (US);
Richard H. Bossi, Renton, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Clarence L. Gordon, III, Renton, WA (US);
Jeffrey R. Kollgaard, Seattle, WA (US);
William P. Motzer, Seattle, WA (US);
Alan Frank Stewart, Seattle, WA (US);
THE BOEING COMPANY, Chicago, IL (US);
Abstract
A method and apparatus for inspecting a test object. The apparatus comprises an inspection vehicle, a sensor structure, a first array of optical fibers, and a second array of optical fibers. The inspection vehicle is configured to move on a surface of the test object. The sensor structure is associated with the inspection vehicle. The first array of optical fibers is associated with the sensor structure. The first array of optical fibers is configured to transmit a pattern of light towards the surface of the test object and the pattern of light is configured to cause sound waves in the test object when the pattern of light encounters the test object. The second array of optical fibers is associated with the sensor structure. The second array of optical fibers is configured to detect a response to the sound waves.