The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Sep. 14, 2009
Applicants:
Vitaly Bezgachev, München, DE;
Marc Hemsendorf, München, DE;
Christian Probst, München, DE;
Stefan Recht, München, DE;
Stephanus Wansleben, Berlin, DE;
Inventors:
Vitaly Bezgachev, München, DE;
Marc Hemsendorf, München, DE;
Christian Probst, München, DE;
Stefan Recht, München, DE;
Stephanus Wansleben, Berlin, DE;
Assignee:
GP Inspect GmbH, Planegg, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 33/00 (2006.01); G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9505 (2013.01); G01N 21/8806 (2013.01);
Abstract
A method of examining an object containing a polycrystalline material, in which at least one part of the surface of the object is illuminated with substantially isotropic light, as well as a illumination device for carrying out the method. In this manner, the polycrystalline material is less influenced by the different reflection characteristics of individual particles of the polycrystalline material.