The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Mar. 18, 2014
Applicants:
Faramarz Farahi, Charlotte, NC (US);
Mehrdad Abolbashari, Charlotte, NC (US);
Gelareh Babaie, Charlotte, NC (US);
Inventors:
Faramarz Farahi, Charlotte, NC (US);
Mehrdad Abolbashari, Charlotte, NC (US);
Gelareh Babaie, Charlotte, NC (US);
Assignee:
The University of North Carolina at Charlotte, Charlotte, NC (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/64 (2006.01); G01B 11/25 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01B 11/25 (2013.01); G01N 2015/145 (2013.01); G01N 2021/6495 (2013.01); G01N 2021/6497 (2013.01);
Abstract
Novel measurement techniques based on moiré techniques and optical frequency conversion. For example, in the IR realm, the configuration can be any moiré configuration, the detector is an IR detector, and the light source can be at any wavelength. The optical configuration, the detector, and the type of light source depend on the physical properties of object/scene and the parameter(s) to be measured.