The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Sep. 27, 2010
Applicants:

Josephus Arnoldus Henricus Maria Kahlman, Tilburg, NL;

Joannes Baptist Adrianus Dionisius Van Zon, Waalre, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); G01N 21/55 (2014.01); G01N 27/00 (2006.01); G01N 21/00 (2006.01); G01J 1/58 (2006.01); G01N 21/552 (2014.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/552 (2013.01); G01N 21/648 (2013.01); G02B 21/367 (2013.01);
Abstract

The invention relates to a method and a sensor device () for detecting particles (MP) that are bound to the binding surface () of a carrier (). The sensor device () comprises a microscope () for imaging bound particles (MP) onto an image sensor (). In order to increase the spatial resolution of the microscope (), a displacement unit () is provided that can displace the carrier () relative to the image sensor (). The distance of a bound particle (MP) from the binding surface () and/or its lateral displacement in reaction to forces can thus be determine with high accuracy. This allows to discriminate specific bindings of large magnetic particles (MP) that are bound to the binding surface () via smaller target particles from nonspecific direct bindings.


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