The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Sep. 24, 2014
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Jianhong Zhang, Beijing, CN;
Hongqiu Wang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yumin Yi, Beijing, CN;
Jianping Gu, Beijing, CN;
Qingping Huang, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A raman spectrum measuring method for drug inspection is provided, comprising: measuring raman spectrum of a sample to be inspected to acquire an original raman spectrum curve of the sample; determining whether the original raman spectrum curve has a characterizing portion, and if not, measuring a mixture of the sample and an enhancing agent to acquire an enhanced raman spectrum curve of the sample; and if the original raman spectrum curve of the sample to be inspected has a characterizing portion, comparing the original raman spectrum curve of the sample with data in an original raman spectrum database of a drug to determine whether the sample contains the drug, otherwise, comparing the enhanced raman spectrum curve of the sample with data in an enhanced raman spectrum database of the drug to determine whether the sample to be inspected contains the drug.